Silicon Analyzer

The MappIR and MAP300 accessories mount in the sample
compartment of the FTIR spectrometer to become a silicon analyzer, offers fully automated accessories for the analysis
of semiconductor wafers. Complete hardware and software package for automated,
multi-position measurements and mapping of semiconductor wafers

．Optional inserts for wafer sizes from 2 to 12 inches
．Specular reflectance and transmission sampling – standard
．Purgeable for removal of atmospheric interferences

1. For semiconductor wafers measurement
2. Automated, multi-position measurements 
3. Graphical and intelligent user interface for setting up mapping patterns
4. The software provides ample flexibility in setting up various experiments

1. Oxygen content determination
2. Carbon content determination
3. Semiconductor Industry
4. Wafer analysis
5. Solar wafer analysis